AFM

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ATOMIC FORCE MICROSCOPE

Activity 4

how did the interaction provide the sample’s surface information?

possible interaction

impact on image of AFM

deflection of the lever

type of interaction

magnetic force microscopy

nanoparticles

thin films

magnetization reversal

electrostatic force microscopy

characterizing surface electrica propertiesl

electronic properties

detect defect on silicon surface

Activity 3

https://www.mindomo.com/mindmap/cd0c0c40278642caa82bc5834b8a388c

image artifacts

vibrations

image processing

scanners

probes

how?

two or more atoms along one direction

hot lattice matched to the sample

rotations of lattice matched

any outsider effect on image formed?

total charge density

orientation of tip

structure of tip

GROUP 5&6

Activity 2

type of operation mode

tapping

non-contact

contact

interaction of the tip with the surface of sample

application

Subtopic

type of cantilever

Activity 1

working principle

imaging

detection method

surface sensing

atomic interaction

coulombic interaction

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